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Special seminar

Introduction to FIB/DualBeam Technology and Applications

Lucille A. Giannuzzi, Ph.D.  FEI Company

 February 24, 2009 12:00 - 1:00 PM

University of Maryland, Dental School, Room G305

All is welcome

Ion beam microscopy for imaging, cross-sectioning and 3D machining is a rapid growing application area for biological research.

Dr. Giannuzzi 's presentation will include the following topics:

  • FIB milling and applications for site specific specimen preparation for scanning electron microscopy (SEM) and transmission electron microscopy (TEM)
  • Using FIB/SEM DualBeam instrumentation as a 3D characterization tool for microstructure, elemental composition, etc.
  • FIB application in the life sciences, e.g., embedded and cryo tissue, dental implants, plant structure, yeast cells.
  • Examples of basic FIB milling and the uses of gases for ion or electron chemical vapor deposition and gas enhanced etching.

 


 Dr. Giannuzzi's recent publication: "Analysis of Bone/Dental Implant Interfaces with the Use of Focused Ion Beam and Electron Microscopy (3 MB )

Learn more about 3-D analysis of cells and tissues by using focused ion beam..  (400 KB)

Learn more  about focused ion beam and dualbeam instruments...  (700 KB)





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